Invention Application
- Patent Title: DUAL-PORT POSITIVE LEVEL SENSITIVE RESET DATA RETENTION LATCH
- Patent Title (中): 双端口正电位敏感复位数据保持锁
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Application No.: US14454971Application Date: 2014-08-08
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Publication No.: US20150048872A1Publication Date: 2015-02-19
- Inventor: Steven Bartling , Sudhanshu Khanna
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Main IPC: H03K3/037
- IPC: H03K3/037

Abstract:
In an embodiment of the invention, a dual-port positive level sensitive reset data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal CKT goes high, CLKZ goes low, reset control signal REN is high and retention control signal RET is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit D2, the clock signals CKT and CLN, the retain control signals RET, the reset control signal REN and the control signals SS and SSN. The signals CKT, CLKZ, RET, REN, SS and SSN determine whether the output of the clocked inverter or the second data bit D2 is latched in the dual-port latch. Control signal RET determines when data is stored in the dual-port latch during retention mode.
Public/Granted literature
- US09270257B2 Dual-port positive level sensitive reset data retention latch Public/Granted day:2016-02-23
Information query
IPC分类: