发明申请
- 专利标题: CALIBRATION ASSEMBLY FOR AIDE IN DETECTION OF ANALYTES WITH ELECTROMAGNETIC READ-WRITE HEADS
- 专利标题(中): 用于电磁读写头检测分析仪的校准组件
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申请号: US14569350申请日: 2014-12-12
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公开(公告)号: US20150097576A1公开(公告)日: 2015-04-09
- 发明人: David Berman , Dylan J. Boday , Icko E. T. Iben , Wayne I. Imaino , Stephen L. Schwartz , Anna W. Topol , Daniel J. Winarski
- 申请人: International Business Machines Corporation
- 主分类号: G01R35/00
- IPC分类号: G01R35/00 ; G01R33/09
摘要:
According to one embodiment, a calibration assembly includes an outer layer having at least one calibration trench extending along a y-axis, and an encapsulation layer within the calibration trench. The encapsulation layer has a plurality of nanoparticles spaced apart along said y-axis of said at least one calibration trench. Each of said plurality of nanoparticles are provided at known y-axis locations in said calibration trench, and each of the plurality of nanoparticles have a known magnetic property.
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