发明申请
US20150102232A1 IONIZATION METHOD, IONIZATION APPARATUS, AND MASS ANALYSIS SYSTEM
有权
离子化方法，离子化装置和质量分析系统
- 专利标题： IONIZATION METHOD, IONIZATION APPARATUS, AND MASS ANALYSIS SYSTEM
- 专利标题（中）： 离子化方法，离子化装置和质量分析系统
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申请号： US14383607申请日： 2012-08-27
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公开(公告)号： US20150102232A1公开(公告)日： 2015-04-16
- 发明人: Hiroyuki Satake , Hideki Hasegawa , Yuichiro Hahimoto , Masao Suga , Izumi Waki
- 申请人： Hiroyuki Satake , Hideki Hasegawa , Yuichiro Hahimoto , Masao Suga , Izumi Waki
- 申请人地址： JP Tokyo
- 专利权人： HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人： HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址： JP Tokyo
- 优先权： JP2012-052485 20120309
- 国际申请： PCT/JP2012/071534 WO 20120827
- 主分类号： G01N30/72
- IPC分类号： G01N30/72 ; H01J49/16 ; H01J49/04
摘要：
In order to achieve an ionization method of high robustness with a small carry-over or less crosstalk, an ionization method is disclosed. A method includes the steps of: joining an ionization unit to a tube; sucking the sample from a sample container into a sample holder of the ionization unit to hold the sample; moving the ionization unit holding the sample to near the ionization unit using an ionization unit drive unit; and applying a voltage to the ionization unit using a power supply to ionize the sample by electrostatically spraying the sample from the holding unit.