Invention Application
- Patent Title: SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
- Patent Title (中): 基板处理装置和基板处理方法
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Application No.: US14522711Application Date: 2014-10-24
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Publication No.: US20150126044A1Publication Date: 2015-05-07
- Inventor: Hitoshi KATO , Hiroyuki KIKUCHI , Masato YONEZAWA , Jun SATO , Shigehiro MIURA
- Applicant: Tokyo Electron Limited
- Priority: JP2013-230080 20131106
- Main IPC: C23C16/50
- IPC: C23C16/50 ; H01L21/02 ; C23C16/505 ; H01J37/32 ; C23C16/458 ; C23C16/455

Abstract:
A substrate processing apparatus includes a vacuum chamber including a top plate, a rotary table rotatably disposed in the vacuum chamber, a first process gas supply part that supplies a first process gas to be adsorbed on a surface of a substrate placed on the rotary table, a plasma processing gas supply part that is disposed apart from the first process gas supply part in a circumferential direction of the rotary table and supplies a second process gas to the surface of the substrate, a separation gas supply part that supplies a separation gas for separating the first process gas and the second process gas, a plasma generator that converts the second process gas into plasma, and an elevating mechanism that moves at least one of the plasma generator and the rotary table upward and downward.
Public/Granted literature
- US09865454B2 Substrate processing apparatus and substrate processing method Public/Granted day:2018-01-09
Information query
IPC分类: