发明申请
US20150162064A1 REFRESH CONTROL CIRCUIT OF SEMICONDUCTOR APPARATUS AND REFRESH METHOD USING THE SAME 有权
半导体器件的刷新控制电路和使用其的刷新方法

  • 专利标题: REFRESH CONTROL CIRCUIT OF SEMICONDUCTOR APPARATUS AND REFRESH METHOD USING THE SAME
  • 专利标题(中): 半导体器件的刷新控制电路和使用其的刷新方法
  • 申请号: US14243651
    申请日: 2014-04-02
  • 公开(公告)号: US20150162064A1
    公开(公告)日: 2015-06-11
  • 发明人: Sang Mook OHTae Sik YUN
  • 申请人: SK HYNIX INC.
  • 申请人地址: KR ICHEON-SI
  • 专利权人: SK HYNIX INC.
  • 当前专利权人: SK HYNIX INC.
  • 当前专利权人地址: KR ICHEON-SI
  • 优先权: KR10-2013-0152122 20131209
  • 主分类号: G11C11/406
  • IPC分类号: G11C11/406
REFRESH CONTROL CIRCUIT OF SEMICONDUCTOR APPARATUS AND REFRESH METHOD USING THE SAME
摘要:
A refresh control circuit of a semiconductor apparatus includes a repair address processing unit configured to compare refresh addresses and repair information, activate a redundant enable signal, and convert the semiconductor apparatus into the same operation state as an initialization state of the repair information in response to activation of a repair initialization signal; a refresh counter configured to count the refresh addresses extended to a signal bit in response to activation of a redundant count enable signal; and a refresh control unit configured to activate the repair initialization signal and the redundant count enable signal when an additional refresh mode is set in response to a refresh command.
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