发明申请
US20150162064A1 REFRESH CONTROL CIRCUIT OF SEMICONDUCTOR APPARATUS AND REFRESH METHOD USING THE SAME
有权
半导体器件的刷新控制电路和使用其的刷新方法
- 专利标题: REFRESH CONTROL CIRCUIT OF SEMICONDUCTOR APPARATUS AND REFRESH METHOD USING THE SAME
- 专利标题(中): 半导体器件的刷新控制电路和使用其的刷新方法
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申请号: US14243651申请日: 2014-04-02
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公开(公告)号: US20150162064A1公开(公告)日: 2015-06-11
- 发明人: Sang Mook OH , Tae Sik YUN
- 申请人: SK HYNIX INC.
- 申请人地址: KR ICHEON-SI
- 专利权人: SK HYNIX INC.
- 当前专利权人: SK HYNIX INC.
- 当前专利权人地址: KR ICHEON-SI
- 优先权: KR10-2013-0152122 20131209
- 主分类号: G11C11/406
- IPC分类号: G11C11/406
摘要:
A refresh control circuit of a semiconductor apparatus includes a repair address processing unit configured to compare refresh addresses and repair information, activate a redundant enable signal, and convert the semiconductor apparatus into the same operation state as an initialization state of the repair information in response to activation of a repair initialization signal; a refresh counter configured to count the refresh addresses extended to a signal bit in response to activation of a redundant count enable signal; and a refresh control unit configured to activate the repair initialization signal and the redundant count enable signal when an additional refresh mode is set in response to a refresh command.
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