公开(公告)号：US20150162064A1

公开(公告)日：2015-06-11

申请号：US14243651

申请日：2014-04-02

申请人： SK HYNIX INC.

发明人： Sang Mook OH ,  Tae Sik YUN

IPC分类号： G11C11/406

CPC分类号： G11C11/406 ,  G11C8/04 ,  G11C8/18 ,  G11C11/4072 ,  G11C11/4087 ,  G11C29/04 ,  G11C29/783 ,  G11C2029/4402 ,  G11C2211/4065

摘要： A refresh control circuit of a semiconductor apparatus includes a repair address processing unit configured to compare refresh addresses and repair information, activate a redundant enable signal, and convert the semiconductor apparatus into the same operation state as an initialization state of the repair information in response to activation of a repair initialization signal; a refresh counter configured to count the refresh addresses extended to a signal bit in response to activation of a redundant count enable signal; and a refresh control unit configured to activate the repair initialization signal and the redundant count enable signal when an additional refresh mode is set in response to a refresh command.

摘要翻译： 半导体装置的刷新控制电路包括修复地址处理单元，被配置为比较刷新地址和修复信息，激活冗余使能信号，并且将半导体装置转换为与修复信息的初始化状态相同的操作状态，以响应于 激活修复初始化信号; 刷新计数器，配置为响应于冗余计数使能信号的激活而对扩展到信号位的刷新地址进行计数; 以及刷新控制单元，被配置为当响应于刷新命令设置附加刷新模式时，激活修复初始化信号和冗余计数使能信号。

公开(公告)号：US20160178666A1

公开(公告)日：2016-06-23

申请号：US14663684

申请日：2015-03-20

申请人： SK hynix Inc.

发明人： Sang Mook OH

IPC分类号： G01R1/067 ,  G01R31/28

CPC分类号： G01R1/06794 ,  G01R31/2889 ,  G01R31/2891

摘要： An apparatus for checking alignment and an integrated circuit including the same are disclosed. The apparatus includes a center pad, an edge pad configured to surround the center pad and including an opening in at least one side, and a connection wiring configured to pass through the opening and electrically couple the center pad and an internal circuit.

摘要翻译： 公开了一种用于检查对准的装置和包括其的集成电路。 该装置包括中心焊盘，边缘焊盘，其被配置为围绕中心焊盘并且在至少一个侧面中包括开口，以及连接配线，被配置为穿过所述开口并电连接所述中心焊盘和内部电路。