发明申请
US20150218935A1 SYSTEM AND METHOD FOR MEASURING GAPS USING AN OPTO-ANALYTICAL DEVICE
有权
使用光学分析装置测量GAPS的系统和方法
- 专利标题： SYSTEM AND METHOD FOR MEASURING GAPS USING AN OPTO-ANALYTICAL DEVICE
- 专利标题（中）： 使用光学分析装置测量GAPS的系统和方法
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申请号： US14424794申请日： 2012-08-31
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公开(公告)号： US20150218935A1公开(公告)日： 2015-08-06
- 发明人: Michael T. Pelletier , Robert P. Freese , Gary E. Weaver , Shilin Chen
- 申请人： Michael T. Pelletier , Robert P. Freese , Gary E. Weaver , Shilin Chen
- 申请人地址： US TX Houston
- 专利权人： Halliburton Energy Services, Inc.
- 当前专利权人： Halliburton Energy Services, Inc.
- 当前专利权人地址： US TX Houston
- 国际申请： PCT/US12/53474 WO 20120831
- 主分类号： E21B47/09
- IPC分类号： E21B47/09 ; E21B10/42 ; E21B7/00 ; E21B12/02
摘要：
In one embodiment, a method includes drilling a wellbore in a formation with a drilling tool. The method further includes receiving electromagnetic radiation using an opto-analytical device coupled to the drilling tool. The method also includes determining a distance between a portion of the drilling tool and the formation based on the received electromagnetic radiation.
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