发明申请
US20150228768A1 Tunneling Field Effect Transistor with New Structure and Preparation Method Thereof 有权
具有新结构的隧道场效应晶体管及其制备方法

  • 专利标题: Tunneling Field Effect Transistor with New Structure and Preparation Method Thereof
  • 专利标题(中): 具有新结构的隧道场效应晶体管及其制备方法
  • 申请号: US14542825
    申请日: 2014-11-17
  • 公开(公告)号: US20150228768A1
    公开(公告)日: 2015-08-13
  • 发明人: Jing ZhaoXichao YangChen-Xiong Zhang
  • 申请人: Huawei Technologies Co., Ltd.
  • 优先权: CN201410045496.4 20140208
  • 主分类号: H01L29/66
  • IPC分类号: H01L29/66 H01L29/08
Tunneling Field Effect Transistor with New Structure and Preparation Method Thereof
摘要:
A tunneling field effect transistor with a new structure and a preparation method thereof are provided. The tunneling field effect transistor includes an active region between a source and a drain, a gate dielectric layer, and a gate located on a side of the gate dielectric layer deviating from the source, and a tunneling region disposed between the gate dielectric layer and the source and in contact with both the gate dielectric layer and the source. The source includes at least a first area and a second area perpendicularly connected in an “L” shape. The tunneling region is in contact with at least the first area and the second area. The gate dielectric layer is in contact with at least the tunneling region and the source.
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