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Invention Application
US20150253558A1 MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND PROGRAM 有权
测量装置，测量系统，测量方法和程序

  • Patent Title: MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND PROGRAM
  • Patent Title (中): 测量装置，测量系统，测量方法和程序
  • Application No.: US14628624
    Application Date: 2015-02-23
  • Publication No.: US20150253558A1
    Publication Date: 2015-09-10
  • Inventor: Yoshiki Okamoto , Masaaki Hara , Terumasa Ito
  • Applicant: Sony Corporation
  • Applicant Address: JP Tokyo
  • Assignee: Sony Corporation
  • Current Assignee: Sony Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2014-042015 20140304
  • Main IPC: G02B21/00
  • IPC: G02B21/00
MEASUREMENT APPARATUS, MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND PROGRAM
Abstract:
There is provided a measurement apparatus including a control unit configured to control an on/off state of illumination that does not contribute to acquisition of measurement data on the basis of an acquisition time period of the measurement data.
Abstract(Chinese):

提供了一种测量装置，包括：控制单元，被配置为基于测量数据的获取时间段来控制对于测量数据的获取无贡献的照明的开/关状态。

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