Invention Application
- Patent Title: METHOD OF DYNAMICALLY CHANGING STITCH DENSITY FOR OPTIMAL QUILTER THROUGHPUT
- Patent Title (中): 动态切割深度的动态密度变化方法
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Application No.: US14665425Application Date: 2015-03-23
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Publication No.: US20150267330A1Publication Date: 2015-09-24
- Inventor: JOSHUA A. CARRIER , JOHN TONY GARRETT , JEFFERSON W. MYERS , TERRANCE L. MYERS , JASON B. TURNER
- Applicant: L & P PROPERTY MANAGEMENT COMPANY
- Main IPC: D05B11/00
- IPC: D05B11/00 ; D05B19/12

Abstract:
A method of dynamically changing stitch density of a quilting pattern during sewing is provided. Embodiments of the invention include dynamically changing stitch density along an axis of a sewing pattern based on identifying sewing pattern elements, which may include line segments and arc segments. Each of the line segments and/or arc segments is assigned a dynamically adjusted stitch density based on analysis of each pattern element and/or adjacent element. An adjusted stitch density is assigned to portions of pattern elements that satisfy a threshold measurement for sewing with an adjusted stitch density. In embodiments, a standard stitch density, intermediate stitch density, or an altered stitch density is automatically assigned to each portion of a sewing pattern based on an analysis of threshold length of an element, a threshold angle of a portion of the element with respect to the axis, and/or the stitch density assigned to an adjacent element.
Public/Granted literature
- US09574292B2 Method of dynamically changing stitch density for optimal quilter throughput Public/Granted day:2017-02-21
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