发明申请
- 专利标题: Curved Wafer Processing Method and Apparatus
- 专利标题(中): 弯曲晶片加工方法和装置
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申请号: US14733352申请日: 2015-06-08
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公开(公告)号: US20150270153A1公开(公告)日: 2015-09-24
- 发明人: I-Ming Chang , Wen-Huei Guo , Chih-Hao Chang , Shou-Zen Chang , Clement Hsingjen Wann , Tung Ying Lee , Cheng-Long Chen , Jui-Chien Huang
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 主分类号: H01L21/687
- IPC分类号: H01L21/687 ; H01L21/683
摘要:
An apparatus for and a method of forming a semiconductor structure is provided. The apparatus includes a substrate holder that maintains a substrate such that the processing surface is curved, such as a convex or a concave shape. The substrate is held in place using point contacts, a plurality of continuous contacts extending partially around the substrate, and/or a continuous ring extending completely around the substrate. The processing may include, for example, forming source/drain regions, channel regions, silicides, stress memorization layers, or the like.
公开/授权文献
- US09978630B2 Curved wafer processing method and apparatus 公开/授权日:2018-05-22
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