发明申请
- 专利标题: METHOD FOR FORMING ALIGNED PATTERNS ON A SUBSTRATE
- 专利标题(中): 在基板上形成对准图案的方法
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申请号: US14230127申请日: 2014-03-31
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公开(公告)号: US20150276638A1公开(公告)日: 2015-10-01
- 发明人: Todd Mathew Spath , Gary Alan Kneezel
- 申请人: Todd Mathew Spath , Gary Alan Kneezel
- 主分类号: G01N27/04
- IPC分类号: G01N27/04 ; G01N27/22
摘要:
A method for forming a second pattern in registration with a first pattern on a substrate is disclosed. The method comprises providing the substrate having a first magnitude of an associated electrical characteristic and at least one alignment structure that is associated with a second magnitude of the electrical characteristic different from the first magnitude. A controller is used to control an electrical probe to measure the electrical characteristic at a plurality of positions proximate the substrate. The measured electrical characteristic corresponds to the alignment structure when the probe is proximate to the alignment structure and to the substrate when the probe is not proximate to the alignment structure. The measured electrical characteristics are used to identify a location of the alignment structure. The second pattern is formed so that it is in registration with the first pattern, based on the identified location of the alignment structure.
公开/授权文献
- US09291587B2 Method for forming aligned patterns on a substrate 公开/授权日:2016-03-22