发明申请
US20150279020A1 Display Panel Characterization System With Flatness and Light Leakage Measurement Capabilities 审中-公开
具有平坦度和光泄漏测量能力的显示面板表征系统

  • 专利标题: Display Panel Characterization System With Flatness and Light Leakage Measurement Capabilities
  • 专利标题(中): 具有平坦度和光泄漏测量能力的显示面板表征系统
  • 申请号: US14229649
    申请日: 2014-03-28
  • 公开(公告)号: US20150279020A1
    公开(公告)日: 2015-10-01
  • 发明人: Nathan K. GuptaSupriya GoyalVeysi DemirPatrick KesslerHyungryul J. Choi
  • 申请人: Apple Inc.
  • 申请人地址: US CA Cupertino
  • 专利权人: Apple Inc.
  • 当前专利权人: Apple Inc.
  • 当前专利权人地址: US CA Cupertino
  • 主分类号: G06T7/00
  • IPC分类号: G06T7/00
Display Panel Characterization System With Flatness and Light Leakage Measurement Capabilities
摘要:
A display characterization system may be used to gather display flatness data and light leakage data from a display. The display characterization system may include a camera system that includes flatness measurement cameras and a light leakage measurement camera. The camera system may include a light guide plate covered with a patterned opaque layer or other planar light-emitting structures for emitting patterned light that is reflected from the display. A controller may use the light leakage measurement camera to capture light leakage data while a display backlight unit is on, a reference light source is on, and the planar light-emitting structures are not emitting light. The controller may use the flatness measurement cameras to capture flatness data while the backlight unit is off, the reference light source is off, and the light-emitting structures are reflecting light from the display.
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