Invention Application
US20150310609A1 SYSTEMS AND METHODS FOR REGULARIZED FOURIER ANALYSIS IN X-RAY PHASE CONTRAST IMAGING
有权
用于X射线相位对比成像中的常规四分位数分析的系统和方法
- Patent Title: SYSTEMS AND METHODS FOR REGULARIZED FOURIER ANALYSIS IN X-RAY PHASE CONTRAST IMAGING
- Patent Title (中): 用于X射线相位对比成像中的常规四分位数分析的系统和方法
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Application No.: US14264689Application Date: 2014-04-29
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Publication No.: US20150310609A1Publication Date: 2015-10-29
- Inventor: Jonathan Immanuel Sperl , Kinan Mahdi
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01N23/04 ; G06K9/52 ; A61B6/00

Abstract:
A method of regularization of x-ray phase contrast imaging (XPCi) system measurement data includes obtaining air scan data of the XPCi system prior to the presence of an object undergoing imaging, performing Fourier analysis of the air scan data, computing air coefficients from the result of the performing step, obtaining object scan data of an object undergoing imaging on the XPCi system, regularizing the object scan data, and calculating at least one of absorption image data, differential phase image data, and dark field image data by using object coefficients. A system configured to implement the method and a non-transitory computer-readable medium are disclosed.
Public/Granted literature
- US09330456B2 Systems and methods for regularized Fourier analysis in x-ray phase contrast imaging Public/Granted day:2016-05-03
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