发明申请
- 专利标题： Glitch Detection and Method for Detecting a Glitch
- 专利标题（中）： 毛刺检测和检测毛刺的方法
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申请号： US14811536申请日： 2015-07-28
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公开(公告)号： US20150334499A1公开(公告)日： 2015-11-19
- 发明人: Michael Kropfitsch , Jose Luis Ceballos
- 申请人： Infineon Technologies AG
- 主分类号： H04R29/00
- IPC分类号： H04R29/00 ; H04R19/04 ; H04R19/00
摘要：
System and method for detecting a glitch is disclosed. An embodiment comprises increasing a bias voltage of a first capacitor, sampling an input signal of a first plate of the first capacitor with a time period, mixing the input signal with the sampled input signal, and comparing the mixed signal with a reference signal.
公开/授权文献
- US09729988B2 Glitch detection and method for detecting a glitch 公开/授权日：2017-08-08
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