Invention Application
- Patent Title: INTERFEROMETRIC MEASUREMENT DEVICE COMPRISING A FILTERING INTERFEROMETER
- Patent Title (中): 包含滤波干涉仪的干涉仪测量装置
-
Application No.: US14653330Application Date: 2013-12-12
-
Publication No.: US20150345949A1Publication Date: 2015-12-03
- Inventor: Joachin HONTHAAS , Herve LEFEVRE , Eric DUCLOUX , Jean-Jacques BONNEFOIS
- Applicant: IXBLUE
- Priority: FR1262363 20121219
- International Application: PCT/FR2013/053059 WO 20131212
- Main IPC: G01C19/64
- IPC: G01C19/64

Abstract:
An interferometric measurement device includes a broad-spectrum spontaneous emission light source; a measurement interferometer, receiving as input a light signal with input light power and delivering as output a modulated light signal with output light power, the modulated light signal being modulated at a modulation frequency, depending on a physical parameter (ΩR) to be measured and being proportional to the input light power; an optical radiation detector, receiving the modulated light signal exiting from the measurement interferometer and delivering a modulated electrical signal representative of the output light power; a filtering interferometer, insensitive to the physical parameter to be measured, having a free spectral range ISL and a finesse F selected such that an interval of frequencies, centred around an optimal frequency foptim equal to (2k+1) ISL/2, k being a natural number, and of width Δf equal to [0.9−(3/2F)] ISL, includes the modulation frequency of the modulated light.
Public/Granted literature
- US09766070B2 Interferometric measurement device comprising a filtering interferometer Public/Granted day:2017-09-19
Information query