Invention Application
US20150346096A1 SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN CONTAINER
审中-公开
光谱测量装置,光谱测量方法和样品容器
- Patent Title: SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN CONTAINER
- Patent Title (中): 光谱测量装置,光谱测量方法和样品容器
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Application No.: US14764703Application Date: 2013-09-17
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Publication No.: US20150346096A1Publication Date: 2015-12-03
- Inventor: Kengo SUZUKI , Kazuya IGUCHI , Shigeru EURA , Kenichiro IKEMURA
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Priority: JP2013-019409 20130204
- International Application: PCT/JP2013/075033 WO 20130917
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/01

Abstract:
A spectral measurement apparatus for irradiating a sample as a measurement object with excitation light and detecting light to be measured includes a light source generating the excitation light; an integrator having an input opening portion through which the excitation light is input, and an output opening portion from which the light to be measured is output; a housing portion arranged in the integrator and housing the sample; an incidence optical system making the excitation light incident to the sample; a photodetector detecting the light to be measured output from the output opening portion; and an analysis device calculating a quantum yield of the sample, based on a detection value detected by the photodetector, and the excitation light is applied to the sample so as to include the sample.
Public/Granted literature
- US10209189B2 Spectrum measuring device, spectrum measuring method, and specimen container Public/Granted day:2019-02-19
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