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发明申请
US20150355053A1 METHOD OF INSPECTING A LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING A LIGHT SOURCE MODULE, AND APPARATUS FOR INSPECTING A LIGHT SOURCE MODULE 有权
用于检测缺陷的光源模块的方法，制造光源模块的方法和用于检查光源模块的装置

  • 专利标题： METHOD OF INSPECTING A LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING A LIGHT SOURCE MODULE, AND APPARATUS FOR INSPECTING A LIGHT SOURCE MODULE
  • 专利标题（中）： 用于检测缺陷的光源模块的方法，制造光源模块的方法和用于检查光源模块的装置
  • 申请号： US14581147
    申请日： 2014-12-23
  • 公开(公告)号： US20150355053A1
    公开(公告)日： 2015-12-10
  • 发明人: Won Soo JI , Oh Seok KWON , Dae Seo PARK , Ka Ram LEE
  • 申请人： Won Soo JI , Oh Seok KWON , Dae Seo PARK , Ka Ram LEE
  • 优先权： KR10-2014-0069234 20140609
  • 主分类号： G01M11/02
  • IPC分类号： G01M11/02
METHOD OF INSPECTING A LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING A LIGHT SOURCE MODULE, AND APPARATUS FOR INSPECTING A LIGHT SOURCE MODULE
摘要：
A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.
摘要（中）：

用于检查光源模块的缺陷的方法包括：准备安装有发光装置和覆盖发光装置的透镜的基板。 向发光器件施加电流以使发光器件导通。 透镜在开启发光器件时成像。 基于获得的图像计算表示来自透镜中心的发光分布的对称性的中心对称，并将计算出的中心对称性与参考值进行比较，以确定是否发生不对称发光分布。 另外提供用于检查光源模块的各种其它方法和装置。

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