METHOD OF MANUFACTURING LIGHT-EMITTING APPARATUS, LIGHT-EMITTING MODULE INSPECTING APPARATUS, AND METHOD OF DETERMINING WHETHER LIGHT-EMITTING MODULE MEETS QUALITY REQUIREMENT
    1.
    发明申请
    METHOD OF MANUFACTURING LIGHT-EMITTING APPARATUS, LIGHT-EMITTING MODULE INSPECTING APPARATUS, AND METHOD OF DETERMINING WHETHER LIGHT-EMITTING MODULE MEETS QUALITY REQUIREMENT 审中-公开
    制造发光装置的方法,发光模块检测装置以及确定发光模块满足质量要求的方法

    公开(公告)号:US20160133805A1

    公开(公告)日:2016-05-12

    申请号:US14937347

    申请日:2015-11-10

    Abstract: A method of manufacturing a light-emitting apparatus includes disposing a substrate on a support; disposing a light-emitting package including a light-emitting device on the substrate so as to allow the light-emitting package to be positioned at a target position on the substrate; applying energy to the light-emitting package to make the light-emitting device emit light; and analyzing the light that is emitted from the light-emitting device due to the energy, and determining a position where the light-emitting package is actually disposed. Thus, the light-emitting apparatus may be easily and inexpensively manufactured, and may generate a limited number of spots and provide improved uniform brightness.

    Abstract translation: 一种制造发光装置的方法包括:将基板设置在支撑体上; 在基板上设置包括发光器件的发光封装,以使发光封装件位于基板上的目标位置; 向发光封装施加能量,使发光元件发光; 并且分析由于能量而从发光装置发射的光,并且确定实际设置发光封装的位置。 因此,发光装置可以容易且廉价地制造,并且可以产生有限数量的斑点并提供改善的均匀亮度。

    METHOD OF INSPECTING A LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING A LIGHT SOURCE MODULE, AND APPARATUS FOR INSPECTING A LIGHT SOURCE MODULE
    2.
    发明申请
    METHOD OF INSPECTING A LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING A LIGHT SOURCE MODULE, AND APPARATUS FOR INSPECTING A LIGHT SOURCE MODULE 有权
    用于检测缺陷的光源模块的方法,制造光源模块的方法和用于检查光源模块的装置

    公开(公告)号:US20150355053A1

    公开(公告)日:2015-12-10

    申请号:US14581147

    申请日:2014-12-23

    CPC classification number: G01M11/0278 G01J1/42 G01J2001/4252 G01M11/0257

    Abstract: A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.

    Abstract translation: 用于检查光源模块的缺陷的方法包括:准备安装有发光装置和覆盖发光装置的透镜的基板。 向发光器件施加电流以使发光器件导通。 透镜在开启发光器件时成像。 基于获得的图像计算表示来自透镜中心的发光分布的对称性的中心对称,并将计算出的中心对称性与参考值进行比较,以确定是否发生不对称发光分布。 另外提供用于检查光源模块的各种其它方法和装置。

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