Invention Application
- Patent Title: SEMICONDUCTOR DEVICE
- Patent Title (中): 半导体器件
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Application No.: US14837177Application Date: 2015-08-27
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Publication No.: US20150364477A1Publication Date: 2015-12-17
- Inventor: Shunpei YAMAZAKI , Jun KOYAMA , Kiyoshi KATO
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Priority: JP2009-288474 20091218; JP2009-294790 20091225
- Main IPC: H01L27/115
- IPC: H01L27/115 ; H01L29/24 ; H01L29/78 ; H01L49/02 ; H01L23/528 ; H01L29/786 ; H01L27/12

Abstract:
A first transistor including a channel formation region, a first gate insulating layer, a first gate electrode, and a first source electrode and a first drain electrode; a second transistor including an oxide semiconductor layer, a second source electrode and a second drain electrode, a second gate insulating layer, and a second gate electrode; and a capacitor including one of the second source electrode and the second drain electrode, the second gate insulating layer, and an electrode provided to overlap with one of the second source electrode and the second drain electrode over the second gate insulating layer are provided. The first gate electrode and one of the second source electrode and the second drain electrode are electrically connected to each other.
Public/Granted literature
- US09978757B2 Semiconductor device Public/Granted day:2018-05-22
Information query
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