Invention Application
- Patent Title: HIGH-RELIABILITY HIGH-SPEED MEMRISTOR
- Patent Title (中): 高可靠性高速电容器
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Application No.: US14845735Application Date: 2015-09-04
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Publication No.: US20150380643A1Publication Date: 2015-12-31
- Inventor: Feng Miao , Jianhua Yang , John Paul Strachan , Wei Yi , Gilberto Medeiros Ribeiro , R. Stanley Williams
- Applicant: Hewlett-Packard Development Company, L.P.
- Main IPC: H01L45/00
- IPC: H01L45/00 ; G11C13/00

Abstract:
A memristor has a first electrode, a second electrode parallel to the first electrode, and a switching layer disposing between the first and second electrodes. The switching layer contains a conduction channel and a reservoir zone. The conduction channel has a Fermi glass material with a variable concentration of mobile ions. The reservoir zone is laterally disposed relative to the conduction channel, and functions as a source/sink of mobile ions for the conduction channel. In the switching operation, under the cooperative driving force of both electric field and thermal effects, the mobile ions are moved into or out of the laterally disposed reservoir zone to vary the concentration of the mobile ions in the conduction channel to change the conductivity of the Fermi glass material.
Public/Granted literature
- US09478738B2 High-reliability high-speed memristor Public/Granted day:2016-10-25
Information query
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