发明申请
US20160013406A1 VARIABLE RESISTIVE MEMORY DEVICE 审中-公开
可变电阻存储器件

  • 专利标题: VARIABLE RESISTIVE MEMORY DEVICE
  • 专利标题(中): 可变电阻存储器件
  • 申请号: US14791619
    申请日: 2015-07-06
  • 公开(公告)号: US20160013406A1
    公开(公告)日: 2016-01-14
  • 发明人: JIN-WOO LEEYOUN-SEON KANG
  • 申请人: JIN-WOO LEEYOUN-SEON KANG
  • 优先权: KR10-2014-0085354 20140708
  • 主分类号: H01L45/00
  • IPC分类号: H01L45/00
VARIABLE RESISTIVE MEMORY DEVICE
摘要:
A variable resistance memory device includes a first electrode layer, a variable resistance layer disposed on the first electrode layer, a second electrode layer disposed on the variable resistance layer, a barrier layer disposed between the variable resistance layer and one of the first and second electrode layers, and a buffer layer disposed between the barrier layer and one of the first and second electrode layers.
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