Invention Application
US20160025644A1 METHOD AND SYSTEM FOR OPTICALLY INSPECTING A MANUFACTURED PART AT A SINGLE INSPECTION STATION HAVING A MEASUREMENT AXIS
有权
在具有测量轴的单个检查站中对制造部件进行光学检查的方法和系统
- Patent Title: METHOD AND SYSTEM FOR OPTICALLY INSPECTING A MANUFACTURED PART AT A SINGLE INSPECTION STATION HAVING A MEASUREMENT AXIS
- Patent Title (中): 在具有测量轴的单个检查站中对制造部件进行光学检查的方法和系统
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Application No.: US14876187Application Date: 2015-10-06
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Publication No.: US20160025644A1Publication Date: 2016-01-28
- Inventor: Michael G. Nygaard , Laura L. Poletti
- Applicant: GII ACQUISITION, LLC dba GENERAL INSPECTION, LLC
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01B11/02

Abstract:
A method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis are provided. The system comprises a fixture assembly which includes a rotatable first fixturing component to support a part in a generally vertical orientation and a rotatable second fixturing component mating with and removably connected to the first fixturing component to transmit torque from the first fixturing component to the second fixturing component. The second fixturing component includes a device for holding the part in a generally horizontal orientation and to permit rotation of the horizontally held part about the measurement axis between first and second predetermined angular positions about the axis. The system also comprises an actuator assembly, a backside illumination assembly, a frontside illumination device, a lens and detector assembly and at least one processor to process electrical signals generated by the lens and detector assembly.
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