Methods are provided for evaluating the insect resistance of a plant of interest. Specifically, methods are provided for high-throughput screening of soybean plants for resistance to kudzu bugs and stink bugs, including the brown marmorated stink bug and the southern green stink bug. In some embodiments, infesting emergent soybean seedlings with second instar stink bug nymphs and maintaining the nymphs in a closed environment with the seedling for only about 7 days allows evaluation of the stink bug resistance of a soybean variety of interest. Also provided are insect resistant plants, particularly plants resistant to kudzu bugs and stink bugs, as well as seeds produced by the resistant plants. Plants disclosed herein can be used to transfer the resistant trait into plant lines of interest.