Invention Application
- Patent Title: DEVICE FOR MEASURING THE ACCURACY OF A MECHANICAL WATCH
- Patent Title (中): 用于测量机械手表精度的装置
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Application No.: US14944990Application Date: 2015-11-18
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Publication No.: US20160070236A1Publication Date: 2016-03-10
- Inventor: Michel WILLEMIN , Cedric DECOSTERD , Thierry HESSLER , Thierry CONUS
- Applicant: The Swatch Group Research and Development Ltd.
- Applicant Address: CH Marin
- Assignee: The Swatch Group Research and Development Ltd.
- Current Assignee: The Swatch Group Research and Development Ltd.
- Current Assignee Address: CH Marin
- Priority: EP10192725.9 20101126
- Main IPC: G04D7/00
- IPC: G04D7/00 ; G04D7/12

Abstract:
A device for measuring the accuracy of a mechanical watch includes a time reference source, a calculating mechanism, and another data processing unit. The time reference source is formed by an internal time reference source, or by a receiving and processing mechanism arranged to receive and process signals transmitted by an external time source to permanently update a repeater clock internal to the device. The calculating mechanism is arranged to calculate time differences between display values, and/or between time reference points provided by the time reference source, and to calculate a variation in rate. The another data processing unit is arranged to store and process at least one variation in rate calculated by the calculating mechanism, and/or a viewing mechanism arranged to display at least one variation in rate calculated by the calculating mechanism.
Public/Granted literature
- US09383725B2 Device for measuring the accuracy of a mechanical watch Public/Granted day:2016-07-05
Information query
IPC分类:
G | 物理 |
G04 | 测时学 |
G04D | 为制造或维修钟表所专门设计的装置或工具 |
G04D7/00 | 测量、计数、校准、检验或调整装置 |