Invention Application
- Patent Title: IDENTIFYING A DEFECT IN A DATA-STORAGE MEDIUM
- Patent Title (中): 识别数据存储介质中的缺陷
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Application No.: US14949328Application Date: 2015-11-23
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Publication No.: US20160077941A1Publication Date: 2016-03-17
- Inventor: SHAYAN SRINIVASA GARANI , SIVAGNANAM PARTHASARATHY
- Applicant: STMICROELECTRONICS, INC.
- Main IPC: G06F11/20
- IPC: G06F11/20

Abstract:
An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region.
Public/Granted literature
- US09837119B2 Identifying a defect in a data-storage medium Public/Granted day:2017-12-05
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