公开(公告)号：US20160077941A1

公开(公告)日：2016-03-17

申请号：US14949328

申请日：2015-11-23

Applicant: STMICROELECTRONICS, INC.

Inventor： SHAYAN SRINIVASA GARANI ,  SIVAGNANAM PARTHASARATHY

IPC: G06F11/20

CPC classification number: G11B20/1833 ,  G06F11/2094 ,  G06F2201/805 ,  G06F2201/85 ,  G11B20/10037 ,  G11B20/10046 ,  G11B20/10064 ,  G11B20/10074 ,  G11B20/10222 ,  G11B20/10287 ,  G11B20/10296 ,  G11B20/10379 ,  G11B2020/1823 ,  G11B2020/1826 ,  G11B2020/185 ,  G11B2020/1863 ,  G11B2220/2516

Abstract: An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region.

Abstract translation: 数据读取路径的实施例包括缺陷检测器和数据恢复电路。 缺陷检测器可操作以识别数据存储介质的缺陷区域，并且数据恢复电路可操作以响应于缺陷检测器从数据存储介质中恢复数据。 例如，这样的实施例可以允许识别例如由划痕或污染导致的数据存储盘的缺陷区域，并且可以允许恢复写入到缺陷区域的数据。