Invention Application
US20160087170A1 METHOD AND SYSTEM FOR PRODUCING OPTICAL SEMICONDUCTOR DEVICE, PRODUCTION CONDITION DETERMINATION DEVICE AND PRODUCTION MANAGEMENT DEVICE
审中-公开
用于生产光学半导体器件的方法和系统，生产条件确定装置和生产管理装置
- Patent Title: METHOD AND SYSTEM FOR PRODUCING OPTICAL SEMICONDUCTOR DEVICE, PRODUCTION CONDITION DETERMINATION DEVICE AND PRODUCTION MANAGEMENT DEVICE
- Patent Title (中): 用于生产光学半导体器件的方法和系统，生产条件确定装置和生产管理装置
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Application No.: US14778197Application Date: 2014-03-13
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Publication No.: US20160087170A1Publication Date: 2016-03-24
- Inventor: Hiroyuki KATAYAMA , Hisataka ITO , Munehisa MITANI
- Applicant: NITTO DENKO CORPORATION
- Applicant Address: JP Ibaraki-shi, Osaka
- Assignee: NITTO DENKO CORPORATION
- Current Assignee: NITTO DENKO CORPORATION
- Current Assignee Address: JP Ibaraki-shi, Osaka
- Priority: JP2013-069496 20130328; JP2013-251346 20131204
- International Application: PCT/JP14/56750 WO 20140313
- Main IPC: H01L33/56
- IPC: H01L33/56
Abstract:
A method for producing an optical semiconductor device including a varnish production step of producing a varnish containing particles and a curable resin, a cover layer production step of producing an A-stage cover layer from the varnish, and a covering step of covering the optical semiconductor element with the A-stage covering layer.
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