Invention Application
- Patent Title: ESTIMATING FLASH QUALITY USING SELECTIVE ERROR EMPHASIS
- Patent Title (中): 使用选择性错误来评估闪光质量
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Application No.: US14501081Application Date: 2014-09-30
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Publication No.: US20160092284A1Publication Date: 2016-03-31
- Inventor: Yael Shur , Eyal Gurgi , Moshe Neerman , Naftali Sommer
- Applicant: APPLE INC.
- Main IPC: G06F11/07
- IPC: G06F11/07

Abstract:
A method for data storage includes reading from a memory device data that is stored in a group of memory cells as respective analog values, and classifying readout errors in the read data into at least first and second different types, depending on zones in which the analog values fall. A memory quality that emphasizes the readout errors of the second type is assigned to the group of the memory cells, based on evaluated numbers of the readout errors of the first and second types.
Public/Granted literature
- US09594615B2 Estimating flash quality using selective error emphasis Public/Granted day:2017-03-14
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