Invention Application
- Patent Title: Magnetic Field Sensors With Self Test
- Patent Title (中): 自检磁场传感器
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Application No.: US14506024Application Date: 2014-10-03
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Publication No.: US20160097825A1Publication Date: 2016-04-07
- Inventor: Craig S. Petrie , Bryan Cadugan , David Toebes , Michael C. Doogue , William P. Taylor
- Applicant: Allegro Microsystems, LLC
- Applicant Address: US MA Worcester
- Assignee: Allegro Microsystems, LLC
- Current Assignee: Allegro Microsystems, LLC
- Current Assignee Address: US MA Worcester
- Main IPC: G01R33/07
- IPC: G01R33/07 ; G01R33/09

Abstract:
A system includes a magnetic target and a magnetic field sensor. The magnetic field sensor comprises an output node; a circuit to detect a magnetic field produced by the magnetic target; and a processor. The processor may be configured to transmit a signal onto the output node representing the detected magnetic field; detect whether the transmitted signal is interrupted by an external source; and, if the signal is interrupted, initiate a self-test of the apparatus. Corresponding methods and apparatuses are also disclosed.
Public/Granted literature
- US09739846B2 Magnetic field sensors with self test Public/Granted day:2017-08-22
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