Invention Application
- Patent Title: PARTICULATE MEASUREMENT SYSTEM
- Patent Title (中): 粒度测量系统
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Application No.: US14872447Application Date: 2015-10-01
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Publication No.: US20160103054A1Publication Date: 2016-04-14
- Inventor: Toshiya MATSUOKA , Takeshi SUGIYAMA
- Applicant: NGK SPARK PLUG CO., LTD.
- Applicant Address: JP Nagoya-shi
- Assignee: NGK SPARK PLUG CO., LTD.
- Current Assignee: NGK SPARK PLUG CO., LTD.
- Current Assignee Address: JP Nagoya-shi
- Priority: JP2014-206387 20141007; JP2015-190528 20150929
- Main IPC: G01N15/06
- IPC: G01N15/06 ; G01M15/10

Abstract:
A particulate measurement system includes an ion generation section for generating ions by means of corona discharge; an electrification chamber for electrifying particulates contained in a gas under measurement; a measurement signal generation circuit for generating a measurement signal which correlates with the amount of the particulates; and a particulate amount determination section for determining the amount of the particulates. The particulate measurement system further includes a particle diameter estimation section for estimating the particle diameter of the particulates contained in the gas under measurement. The particulate amount determination section performs correction by multiplying the measurement signal or the amount of the particulates determined from the measurement signal by a coefficient relating to the ratio between the estimated particle diameter and a reference particle diameter.
Public/Granted literature
- US10094756B2 Particulate measurement system Public/Granted day:2018-10-09
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