Invention Application
- Patent Title: Test Device and Imaging Device Including the Same
- Patent Title (中): 包括其的测试设备和成像设备
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Application No.: US14883753Application Date: 2015-10-15
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Publication No.: US20160116578A1Publication Date: 2016-04-28
- Inventor: Jae-hong Kim , Yoshihiko Hayashi , Akinori Okubo
- Applicant: Samsung Electronics Co., Ltd.
- Priority: KR10-2014-0146433 20141027
- Main IPC: G01S7/52
- IPC: G01S7/52 ; G01S15/02

Abstract:
A test device includes a plurality of transceivers that respectively transmit a wave to a test target point of a test object, respectively receive a wave reflected, scattered, or refracted from the test object, and respectively output a signal generated in response to the received wave; a combiner that combines the plurality of received signals generated by the plurality of transceivers; and a plurality of switches that are opened or closed to transfer the plurality of received signals to the combiner or block the plurality of received signals from being transferred to the combiner.
Public/Granted literature
- US09880270B2 Test device and imaging device including the same Public/Granted day:2018-01-30
Information query