公开(公告)号：US10855497B2

公开(公告)日：2020-12-01

申请号：US16288550

申请日：2019-02-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yoshihiko Hayashi ,  Shinya Namioka ,  Chang Eun Lee ,  Sung-Yeol Kim ,  Si Young Koh ,  Hyung-Sun Ryu ,  Jang Yeob Lee ,  Shin Ki Jeong

IPC: H04L25/06 ,  H04L7/00 ,  H04L25/49

Abstract: A semiconductor device including a signal generator and decoding and timing skew adjusting circuit is provided. The signal generator is configured to receive n multi-level signals having m signal levels and convert the n multi-level signals into n*(m−1) single level signals having two signal levels. The decoding and timing skew adjusting circuit is configured to receive the single level signals, perform a predefined operation on the single level signals to generate an output signal, and compensate for timing skew between the n multi-level signals, using the single level signals. The n and m are natural numbers, where n>=2 and m>=3.

公开(公告)号：US09880270B2

公开(公告)日：2018-01-30

申请号：US14883753

申请日：2015-10-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jae-hong Kim ,  Yoshihiko Hayashi ,  Akinori Okubo

IPC: G01S7/52 ,  G01S15/89 ,  G10K11/34 ,  G01N29/06 ,  G01N29/26 ,  G01S17/89 ,  G01S13/89

CPC classification number: G01S7/5205 ,  G01N29/0654 ,  G01N29/262 ,  G01N2291/044 ,  G01S7/52025 ,  G01S7/52047 ,  G01S7/52077 ,  G01S13/89 ,  G01S15/8915 ,  G01S15/8925 ,  G01S15/8929 ,  G01S17/89 ,  G10K11/346

Abstract: A test device includes a plurality of transceivers that respectively transmit a wave to a test target point of a test object, respectively receive a wave reflected, scattered, or refracted from the test object, and respectively output a signal generated in response to the received wave; a combiner that combines the plurality of received signals generated by the plurality of transceivers; and a plurality of switches that are opened or closed to transfer the plurality of received signals to the combiner or block the plurality of received signals from being transferred to the combiner.

公开(公告)号：US20160116578A1

公开(公告)日：2016-04-28

申请号：US14883753

申请日：2015-10-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jae-hong Kim ,  Yoshihiko Hayashi ,  Akinori Okubo

IPC: G01S7/52 ,  G01S15/02

CPC classification number: G01S7/5205 ,  G01N29/0654 ,  G01N29/262 ,  G01N2291/044 ,  G01S7/52025 ,  G01S7/52047 ,  G01S7/52077 ,  G01S13/89 ,  G01S15/8915 ,  G01S15/8925 ,  G01S15/8929 ,  G01S17/89 ,  G10K11/346

Abstract: A test device includes a plurality of transceivers that respectively transmit a wave to a test target point of a test object, respectively receive a wave reflected, scattered, or refracted from the test object, and respectively output a signal generated in response to the received wave; a combiner that combines the plurality of received signals generated by the plurality of transceivers; and a plurality of switches that are opened or closed to transfer the plurality of received signals to the combiner or block the plurality of received signals from being transferred to the combiner.

Abstract translation: 测试装置包括多个收发器，其分别将测试对象的波发送到测试对象点，分别接收从测试对象反射，散射或折射的波，并且分别输出响应于所接收的波产生的信号 ; 组合器，其组合由所述多个收发器产生的所述多个接收信号; 以及多个开关，其被打开或关闭以将所述多个接收到的信号传送到所述组合器或阻止所述多个接收信号被传送到所述组合器。