Invention Application
- Patent Title: EXPORTING MEASUREMENTS OF NANOPORE ARRAYS
- Patent Title (中): 纳米级阵列的出口测量
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Application No.: US14534042Application Date: 2014-11-05
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Publication No.: US20160123923A1Publication Date: 2016-05-05
- Inventor: Roger J.A. Chen , Hui Tian , Santiago Fernandez-Gomez
- Applicant: Genia Technologies, Inc.
- Main IPC: G01N27/447
- IPC: G01N27/447 ; G01N33/487 ; C12Q1/68

Abstract:
A method of exporting measurements of a nanopore sensor on a nanopore based sequencing chip is disclosed. An electrical characteristic associated with the nanopore sensor is measured. The electrical characteristic associated with the nanopore sensor is processed. A summary for the electrical characteristic and one or more previous electrical characteristics is determined. The summary for the electrical characteristic and the one or more previous electrical characteristics are exported. Determining the summary includes determining that the electrical characteristic and at least a portion of the one or more previous electrical characteristics correspond to a base call event at the nanopore sensor. The summary represents the electrical characteristic and the at least a portion of the one or more previous electrical characteristics.
Public/Granted literature
- US10060903B2 Exporting measurements of nanopore arrays Public/Granted day:2018-08-28
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