Invention Application
US20160131531A1 THERMAL TEST BENCH FOR THE RUB STRIP OF A PANTOGRAPH AND PROCESS FOR CORRESPONDING THERMAL TEST
审中-公开
用于陶瓷的RUB条的热测试台和相应的热测试过程
- Patent Title: THERMAL TEST BENCH FOR THE RUB STRIP OF A PANTOGRAPH AND PROCESS FOR CORRESPONDING THERMAL TEST
- Patent Title (中): 用于陶瓷的RUB条的热测试台和相应的热测试过程
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Application No.: US14553080Application Date: 2014-11-25
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Publication No.: US20160131531A1Publication Date: 2016-05-12
- Inventor: Gerard Blanvillain , Gerard Auditeau
- Applicant: Societe Nationale Des Chemins De Fer Francais SNCF
- Priority: FR1361583 20131125
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01N25/00
Abstract:
The invention relates to a heat-testing rig for a pantograph wearing strip (10), comprising a housing (11) for receiving said wearing strip to be tested; current supply and return means (13, 14), characterised in that it comprises at least one tool (15, 16, 17, 18, 19) carrying at least one segment (20, 21) of a catenary contact wire which can be supplied with current by said supply means and can be brought into mechanical contact with an upper surface of said wearing strip (10) to be tested, so as to form a point, known as the hot point, where current passes between this wire segment and said wearing strip, and means for measuring the temperature of said wearing strip. The invention further relates to a corresponding heat-testing method.
Information query
