Invention Application
- Patent Title: METROLOGY METHOD, COMPUTER PRODUCT AND SYSTEM
- Patent Title (中): 计量方法,计算机产品和系统
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Application No.: US14948001Application Date: 2015-11-20
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Publication No.: US20160161863A1Publication Date: 2016-06-09
- Inventor: Arie Jeffrey DEN BOEF , Kaustuve BHATTACHARYYA
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Priority: EP14195009.7 20141126
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G01B11/24 ; G01B11/27

Abstract:
A method including determining a type of structural asymmetry of the target from measured values of the target, and performing a simulation of optical measurement of the target to determine a value of an asymmetry parameter associated with the asymmetry type. A method including performing a simulation of optical measurement of a target to determine a value of an asymmetry parameter associated with a type of structural asymmetry of the target determined from measured values of the target, and analyzing a sensitivity of the asymmetry parameter to change in a target formation parameter associated with the target. A method including determining a structural asymmetry parameter of a target using a measured parameter of radiation diffracted by the target, and determining a property of a measurement beam of the target based on the structural asymmetry parameter that is least sensitive to change in a target formation parameter associated with the target.
Public/Granted literature
- US10527949B2 Metrology method, computer product and system Public/Granted day:2020-01-07
Information query
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