Invention Application
US20160173090A1 APPARATUS AND METHOD FOR DETECTING OR REPAIRING MINIMUM DELAY ERRORS
有权
检测或修复最小延迟错误的装置和方法
- Patent Title: APPARATUS AND METHOD FOR DETECTING OR REPAIRING MINIMUM DELAY ERRORS
- Patent Title (中): 检测或修复最小延迟错误的装置和方法
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Application No.: US14572031Application Date: 2014-12-16
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Publication No.: US20160173090A1Publication Date: 2016-06-16
- Inventor: Pascal A. Meinerzhagen , Sandip Kundu , James W. Tschanz , Vivek K. De
- Applicant: Intel Corporation
- Main IPC: H03K19/003
- IPC: H03K19/003 ; H03K3/037

Abstract:
Described are apparatuses and methods for detecting or repairing minimum-delay errors. The apparatus may include a minimum-delay error detector (MDED) to receive a clock signal and a data path signal and to detect a minimum-delay error (MDE) in the data path based on the received data path signal and the clock signal. The MDE may be repaired by adjusting one or more regional clock buffers coupled to the MDED. Further, the apparatus may include minimum-delay path replicas (MDPRs) used for detecting and repairing MDEs during normal system operations. Other embodiments may be described and/or claimed.
Public/Granted literature
- US09520877B2 Apparatus and method for detecting or repairing minimum delay errors Public/Granted day:2016-12-13
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