Invention Application
- Patent Title: SAMPLE-ANALYZING SYSTEM
- Patent Title (中): 样品分析系统
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Application No.: US14913746Application Date: 2014-07-29
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Publication No.: US20160202854A1Publication Date: 2016-07-14
- Inventor: Hiroyuki Minato
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Priority: JP2013-179181 20130830
- International Application: PCT/JP2014/069964 WO 20140729
- Main IPC: G06F3/0482
- IPC: G06F3/0482 ; G06F17/27 ; G06T7/00 ; G06F17/24 ; G01N30/24 ; G06F3/0484

Abstract:
In a sample-analyzing system including an analyzer (10) for analyzing a sample, an auto-sampler (20) for sequentially introducing a plurality of samples into the analyzer (10), and a controller (40) for controlling operations of the analyzer (10) and the auto-sampler (20), the auto-sampler (20) is provided with a sample rack holder (24) for holding a sample rack (21) having a plurality of wells (22) in which sample containers (23) are to be set and a sample rack imager (27) for taking, directly from above or obliquely from above, an image of the sample rack (21) held in the sample rack holder (24), whereby an incorrect input of the position information of the sample container (e.g. the well number or rack number) into an analysis schedule table is prevented.
Public/Granted literature
- US10191620B2 Sample-analyzing system Public/Granted day:2019-01-29
Information query
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