公开(公告)号：US10191620B2

公开(公告)日：2019-01-29

申请号：US14913746

申请日：2014-07-29

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato

IPC分类号： G01N30/24 ,  G06F3/0482 ,  G06F3/0484 ,  G06F17/24 ,  G06F17/27 ,  G01N35/00 ,  G01N35/04

摘要： In a sample-analyzing system including an analyzer (10) for analyzing a sample, an auto-sampler (20) for sequentially introducing a plurality of samples into the analyzer (10), and a controller (40) for controlling operations of the analyzer (10) and the auto-sampler (20), the auto-sampler (20) is provided with a sample rack holder (24) for holding a sample rack (21) having a plurality of wells (22) in which sample containers (23) are to be set and a sample rack imager (27) for taking, directly from above or obliquely from above, an image of the sample rack (21) held in the sample rack holder (24), whereby an incorrect input of the position information of the sample container (e.g. the well number or rack number) into an analysis schedule table is prevented.

公开(公告)号：US12055529B2

公开(公告)日：2024-08-06

申请号：US17796644

申请日：2020-02-21

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato ,  Nobumitsu Fukushima ,  Erika Baba

IPC分类号： G01N30/54 ,  G01N30/02 ,  G01N30/30

CPC分类号： G01N30/54 ,  G01N30/30 ,  G01N2030/027 ,  G01N2030/3007 ,  G01N2030/3084

摘要： A first attachment portion to which a packed column is attachable and a second attachment portion to which a chip column is attachable are housed in a column oven. Designation of a temperature of the column oven is received by a designated temperature receiver. In a case in which the chip column is not attached to the second attachment portion, an upper limit temperature of the column oven is set to a first temperature by a setter. An upper limit temperature of the column oven is set to a second temperature lower than the first temperature in a case in which the chip column is attached to the second attachment portion. A temperature of the column oven is adjusted to a received temperature by a temperature adjuster in a case in which the received temperature is equal to or lower than an upper limit temperature.

公开(公告)号：US20160202854A1

公开(公告)日：2016-07-14

申请号：US14913746

申请日：2014-07-29

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato

IPC分类号： G06F3/0482 ,  G06F17/27 ,  G06T7/00 ,  G06F17/24 ,  G01N30/24 ,  G06F3/0484

CPC分类号： G06F3/0482 ,  G01N30/24 ,  G01N2035/0093 ,  G01N2035/0493 ,  G06F3/04842 ,  G06F17/245 ,  G06F17/27

摘要： In a sample-analyzing system including an analyzer (10) for analyzing a sample, an auto-sampler (20) for sequentially introducing a plurality of samples into the analyzer (10), and a controller (40) for controlling operations of the analyzer (10) and the auto-sampler (20), the auto-sampler (20) is provided with a sample rack holder (24) for holding a sample rack (21) having a plurality of wells (22) in which sample containers (23) are to be set and a sample rack imager (27) for taking, directly from above or obliquely from above, an image of the sample rack (21) held in the sample rack holder (24), whereby an incorrect input of the position information of the sample container (e.g. the well number or rack number) into an analysis schedule table is prevented.

摘要翻译： 在包括用于分析样品的分析器（10）的样本分析系统中，用于将多个样本顺序地引入分析器（10）的自动采样器（20），以及用于控制分析器 （10）和自动采样器（20）中，自动采样器（20）设置有用于保持具有多个孔（22）的样品架（21）的样品架保持器（24），样品架 23）和用于从上方或倾斜地从上方取出保持在样架架（24）中的样架（21）的图像的样架架成像器（27），由此不正确地输入 防止样品容器的位置信息（例如孔号或架号）进入分析计划表。

公开(公告)号：US11366133B2

公开(公告)日：2022-06-21

申请号：US16649099

申请日：2018-06-20

申请人： Shimadzu Corporation

发明人： Hiroyuki Minato ,  Takashi Inoue

IPC分类号： G01N35/10 ,  B01L3/00 ,  G01N30/24 ,  G01N35/02

摘要： The sample plate has a principal plane in which a plurality of wells is arranged. The sample plate has a plurality of through-holes each allowing a sampling needle to pass through in a region of the principal plane where the wells are not provided, and positions of the wells and positions of the through-holes are designed such that when two pieces of the sample plates are arranged up and down with a predetermined positional relationship in a state in which respective principal planes are arranged in parallel each other, the through-holes of the sample plate arranged on an upper side is arranged at positions directly above respective wells of the sample plate arranged on a lower side.

公开(公告)号：US20170010157A1

公开(公告)日：2017-01-12

申请号：US15204418

申请日：2016-07-07

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato

IPC分类号： G01J3/28 ,  G01N30/74 ,  G01J3/18

CPC分类号： G01J3/18 ,  G01J3/0291 ,  G01J3/10 ,  G01N30/74 ,  G01N21/65

摘要： Provided is a spectroscopic detector including: a light source for generating polychromatic light 11; a single diffraction grating 13; an excitation optical system for guiding the light from the light source 11 onto the diffraction grating 13, for selecting one wavelength from the light diffracted by the diffraction grating 13, and for casting the selected wavelength of light into a sample as excitation light; a detection optical system for guiding observation light emitted from the sample irradiated with the excitation light onto the diffraction grating 13 to disperse the observation light; and a photodetector 15 for detecting the observation light dispersed by the detection optical system. By using one diffraction grating 13 in both the excitation optical system and the detection optical system, the number of diffraction gratings is reduced, whereby both the cost reduction and the downsizing of the device are achieved.

摘要翻译： 本发明提供一种分光检测器，包括：用于产生多色光11的光源; 单个衍射光栅13; 用于将来自光源11的光引导到衍射光栅13上的激发光学系统，用于从由衍射光栅13衍射的光中选择一个波长，并将所选择的波长的光投射到样品中作为激发光; 检测光学系统，用于将从激发光照射的样本发射的观察光引导到衍射光栅13上以分散观察光; 以及用于检测由检测光学系统分散的观察光的光电检测器15。 通过在激发光学系统和检测光学系统中使用一个衍射光栅13，减少了衍射光栅的数量，从而实现了器件的成本降低和尺寸的缩小。

公开(公告)号：US20150000386A1

公开(公告)日：2015-01-01

申请号：US14375517

申请日：2012-12-21

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato

IPC分类号： G01N1/00 ,  G01N35/10 ,  G01N30/00

CPC分类号： G01N1/00 ,  G01N30/00 ,  G01N30/24 ,  G01N35/10 ,  G01N35/1011 ,  G01N2001/002

摘要： An automatic sample pouring device comprising a rack, a sampling needle, a reference portion arranged at a predetermined position of the rack, a detection unit for electrically detecting contact between the reference portion and the needle, and a control unit for controlling an operation of relatively moving the needle on a horizontal plane and in a vertical direction with respect to the rack, and suctioning and pouring operations of a sample. The control unit is configured to control an operation of obtaining reference position information of the rack on the basis of detection information of the detection unit.

摘要翻译： 一种自动抽样装置，包括：机架，采样针，布置在机架的预定位置处的参考部分;用于电检测参考部分和针之间的接触的检测单元;以及用于控制相对的操作的控制单元 在相对于齿条的水平面和垂直方向上移动针，并且抽吸和倾倒样品的操作。 控制部被配置为基于检测单元的检测信息来控制获取机架的基准位置信息的动作。

公开(公告)号：US11933771B2

公开(公告)日：2024-03-19

申请号：US17413808

申请日：2018-12-20

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato ,  Masahide Gunji

IPC分类号： G01N30/74 ,  G01N21/76 ,  G01N30/02 ,  G01N30/06 ,  G01N30/84 ,  G01N30/86

CPC分类号： G01N30/74 ,  G01N30/8631 ,  G01N21/76 ,  G01N2030/027 ,  G01N30/06 ,  G01N30/84 ,  G01N30/86

摘要： A first liquid sending controller of an analysis control device controls a first liquid sender such that a mobile phase is supplied to a fluorescence detector through an analysis column and a junction during an analysis of a sample. A sample introduction controller controls a sample introducer such that the sample is introduced into a mobile phase by the sample introducer at a position farther upstream than the analysis column during the analysis of the sample. The second liquid sending controller causes a second liquid sender to start supplying a fluorescent reaction liquid such that the fluorescent reaction liquid arrives at the junction later than a point in time at which supply of the mobile phase starts and before the sample introduced into the mobile phase arrives at the junction during the analysis of the sample. A generator generates a chromatogram based on an output signal of the fluorescence detector during the analysis of the sample.

公开(公告)号：US10955390B2

公开(公告)日：2021-03-23

申请号：US16638997

申请日：2017-09-01

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato ,  Takaaki Fujita

IPC分类号： G01N30/24 ,  B01D15/14 ,  B08B9/035 ,  G01N30/62 ,  G01N30/02

摘要： An autosampler sucks cleaning liquid from a tip side of a sampling needle and holds the cleaning liquid in the sampling channel before sucking analysis liquid from the tip of the sampling needle, and, after dispensing of the analysis liquid is finished, discharges the cleaning liquid from the tip of the sampling needle, so as to clean the inside of the sampling needle and the sampling channel.

公开(公告)号：US09891104B2

公开(公告)日：2018-02-13

申请号：US15204418

申请日：2016-07-07

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato

IPC分类号： G01J3/28 ,  G01J3/18 ,  G01J3/02 ,  G01J3/10 ,  G01N30/74

CPC分类号： G01J3/18 ,  G01J3/0291 ,  G01J3/10 ,  G01N30/74 ,  G01N21/65

摘要： Provided is a spectroscopic detector including: a light source for generating polychromatic light 11; a single diffraction grating 13; an excitation optical system for guiding the light from the light source 11 onto the diffraction grating 13, for selecting one wavelength from the light diffracted by the diffraction grating 13, and for casting the selected wavelength of light into a sample as excitation light; a detection optical system for guiding observation light emitted from the sample irradiated with the excitation light onto the diffraction grating 13 to disperse the observation light; and a photodetector 15 for detecting the observation light dispersed by the detection optical system. By using one diffraction grating 13 in both the excitation optical system and the detection optical system, the number of diffraction gratings is reduced, whereby both the cost reduction and the downsizing of the device are achieved.

公开(公告)号：US09752934B2

公开(公告)日：2017-09-05

申请号：US14478903

申请日：2014-09-05

申请人： SHIMADZU CORPORATION

发明人： Hiroyuki Minato

IPC分类号： G01J3/42 ,  G01J3/18 ,  G01J3/28

CPC分类号： G01J3/18 ,  G01J3/28 ,  G01J2003/2866

摘要： Provided is a method for performing a wavelength calibration of a monochromator with a diffraction grating by casting light from a standard light source whose emission intensity contains a change with a predetermined cycle onto the diffraction grating and measuring an intensity of light reflected by the grating. The method includes the steps of: measuring at least two times the intensity of the reflected light from the grating within the aforementioned cycle at each of the rotational positions of the grating corresponding to a range of wavelengths including a peak wavelength of a bright line spectral light generated by the standard light source; determining an intensity value 201 at each rotational position based on all the measured values obtained at the rotational position; and locating, as the peak wavelength of the bright line spectral light, a wavelength at which the intensity value 201 is maximized.