Invention Application
- Patent Title: SUBSTRATE INCLUDING SELECTIVELY FORMED BARRIER LAYER
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Application No.: US15072685Application Date: 2016-03-17
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Publication No.: US20160204028A1Publication Date: 2016-07-14
- Inventor: Yuri M. Brovman , Brian M. Erwin , Nicholas A. Polomoff , Jennifer D. Schuler , Matthew E. Souter , Christopher L. Tessler
- Applicant: International Business Machines Corporation , SUSS MicroTec Photonic Systems Inc.
- Main IPC: H01L21/768
- IPC: H01L21/768

Abstract:
A method of selectively locating a barrier layer on a substrate includes forming a barrier layer on a surface of the substrate. The barrier layer comprises of a metal element and a non-metal element. The barrier layer may also be formed from a metal element and non-metal element. The method further includes forming an electrically conductive film layer on the barrier layer, and forming a metallic portion in the electrically conductive film layer. The method further includes selectively ablating portions of the barrier layer from the dielectric layer to selectively locate place the barrier layer on the substrate.
Information query
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