发明申请
- 专利标题： PARTICLE ANALYSIS METHOD AND PARTICLE ANALYSIS DEVICE
- 专利标题（中）： 粒子分析方法和粒子分析装置
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申请号： US14915062申请日： 2014-08-29
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公开(公告)号： US20160209366A1公开(公告)日： 2016-07-21
- 发明人: Makoto KAWANO , Hitoshi WATARAI , Nobutoshi OTA
- 申请人： OSAKA UNIVERSITY
- 申请人地址： JP Osaka
- 专利权人： OSAKA UNIVERSITY
- 当前专利权人： OSAKA UNIVERSITY
- 当前专利权人地址： JP Osaka
- 优先权： JP2013-179145 20130830
- 国际申请： PCT/JP2014/072761 WO 20140829
- 主分类号： G01N27/76
- IPC分类号： G01N27/76 ; G01N15/08 ; G01N15/10
摘要：
A calculation unit (40) obtains the volume magnetic susceptibility of a first particle. Also, the calculation unit (40) obtains the volume magnetic susceptibility of a second particle different from the first particle. Thereafter, the calculation unit (40) obtains a volume occupied by a surface material included in the second particle on the basis of a relationship between the volume magnetic susceptibility of the first particle, the volume of the first particle, the volume magnetic susceptibility of the second particle, the volume of the second particle, the volume occupied by the surface material, and the volume magnetic susceptibility of the surface material.
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