Invention Application
- Patent Title: SUBSTRATE SUPPORT WITH THERMAL ZONES FOR SEMICONDUCTOR PROCESSING
- Patent Title (中): 基板支撑与半导体加工用热区
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Application No.: US15183260Application Date: 2016-06-15
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Publication No.: US20160300741A1Publication Date: 2016-10-13
- Inventor: Harmeet Singh , Keith Gaff , Neil Benjamin , Keith Comendant
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: LAM RESEARCH CORPORATION
- Current Assignee: LAM RESEARCH CORPORATION
- Current Assignee Address: US CA Fremont
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01J37/32 ; H01L21/683

Abstract:
A substrate support in a semiconductor plasma processing apparatus, comprises multiple independently controllable thermal zones arranged in a scalable multiplexing layout, and electronics to independently control and power the thermal zones. A substrate support in which the substrate support is incorporated includes an electrostatic clamping electrode and a temperature controlled base plate. Methods for manufacturing the substrate support include bonding together ceramic or polymer sheets having thermal zones, power supply lines, power return lines and vias.
Public/Granted literature
- US10720346B2 Substrate support with thermal zones for semiconductor processing Public/Granted day:2020-07-21
Information query
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