Invention Application
- Patent Title: METHOD AND APPARATUS FOR IN-SYSTEM MANAGEMENT AND REPAIR OF SEMI-CONDUCTOR MEMORY FAILURE
- Patent Title (中): 半导体存储器故障的系统管理和修复的方法和装置
-
Application No.: US14691570Application Date: 2015-04-20
-
Publication No.: US20160307645A1Publication Date: 2016-10-20
- Inventor: Jung Pill KIM , Dexter Tamio CHUN , Jungwon SUH , Deepti Vijayalakshmi SRIRAMAGIRI , Yanru LI , Mosaddiq SAIFUDDIN , Xiangyu DONG
- Applicant: Qualcomm Incorporated
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G06F11/07 ; G11C29/00

Abstract:
A memory having a redundancy area is operated in a normal mode and an error is detected. A selecting selects between in-line repair process and off-line repair. In-line repair applies a short term error correction, which remaps a fail address to a remapped memory area of the memory. An in-system repair is applied, for a one-time programmed remapping of the fail address to a redundancy area of the memory. In-system repair utilizes idle time of the memory to maintain valid memory content.
Public/Granted literature
- US09812222B2 Method and apparatus for in-system management and repair of semi-conductor memory failure Public/Granted day:2017-11-07
Information query