Invention Application
US20160327638A1 SYSTEMS AND METHODS FOR TIME OF FLIGHT MEASUREMENT USING A SINGLE EXPOSURE
有权
使用单次曝光进行飞行时间测量的系统和方法
- Patent Title: SYSTEMS AND METHODS FOR TIME OF FLIGHT MEASUREMENT USING A SINGLE EXPOSURE
- Patent Title (中): 使用单次曝光进行飞行时间测量的系统和方法
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Application No.: US14703092Application Date: 2015-05-04
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Publication No.: US20160327638A1Publication Date: 2016-11-10
- Inventor: Markus Dielacher , Josef Prainsack , Martin Flatscher , Michael Mark , Hartwig Unterassinger
- Applicant: Infineon Technologies AG
- Main IPC: G01S7/491
- IPC: G01S7/491 ; G01S17/32

Abstract:
A sensor array arrangement for a time of flight measurement system is disclosed. The arrangement includes a plurality of pixels and circuitry. The plurality of pixels are configured such that a first plurality of pixels receive a first reference signal and a second plurality of pixels receive a second reference signal. The first and second reference signals are phase shifted with respect to each other. The circuitry calculates depth information by combining information from first and second pixel sensor signals. The first pixel sensor signal is based on the first reference signal. The second pixel sensor signal is based on the second reference signal.
Public/Granted literature
- US09971023B2 Systems and methods for time of flight measurement using a single exposure Public/Granted day:2018-05-15
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