Invention Application
US20160343796A1 CAPACITOR STRUCTURE AND METHOD FOR FORMING THE SAME 审中-公开
电容器结构及其形成方法

  • Patent Title: CAPACITOR STRUCTURE AND METHOD FOR FORMING THE SAME
  • Patent Title (中): 电容器结构及其形成方法
  • Application No.: US15158814
    Application Date: 2016-05-19
  • Publication No.: US20160343796A1
    Publication Date: 2016-11-24
  • Inventor: Bo-Jr HUANGJia-Wei FANG
  • Applicant: MediaTek Inc.
  • Main IPC: H01L49/02
  • IPC: H01L49/02
CAPACITOR STRUCTURE AND METHOD FOR FORMING THE SAME
Abstract:
A capacitor structure includes first and second interdigitated conductive elements formed over different portions of a semiconductor substrate, and a dielectric layer formed between the first and second interdigitated conductive elements. The first interdigitated conductive element that is formed includes a first base portion and a plurality of first protrusion portions. The second interdigitated conductive element includes a second base portion and a plurality of second protrusion portions. The second protrusion portions of the second interdigitated conductive element are interleaved with the first protrusion portions of the first interdigitated conductive element.
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