Invention Application
- Patent Title: CAPACITOR STRUCTURE AND METHOD FOR FORMING THE SAME
- Patent Title (中): 电容器结构及其形成方法
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Application No.: US15158814Application Date: 2016-05-19
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Publication No.: US20160343796A1Publication Date: 2016-11-24
- Inventor: Bo-Jr HUANG , Jia-Wei FANG
- Applicant: MediaTek Inc.
- Main IPC: H01L49/02
- IPC: H01L49/02

Abstract:
A capacitor structure includes first and second interdigitated conductive elements formed over different portions of a semiconductor substrate, and a dielectric layer formed between the first and second interdigitated conductive elements. The first interdigitated conductive element that is formed includes a first base portion and a plurality of first protrusion portions. The second interdigitated conductive element includes a second base portion and a plurality of second protrusion portions. The second protrusion portions of the second interdigitated conductive element are interleaved with the first protrusion portions of the first interdigitated conductive element.
Information query
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