发明申请
US20160344414A1 FAULT TOLERANT SYNDROME EXTRACTION AND DECODING IN BACON-SHOR QUANTUM ERROR CORRECTION
有权
故障综合征提取和解码在BACON-SHOR QUANTUM ERROR CORRECTION
- 专利标题: FAULT TOLERANT SYNDROME EXTRACTION AND DECODING IN BACON-SHOR QUANTUM ERROR CORRECTION
- 专利标题(中): 故障综合征提取和解码在BACON-SHOR QUANTUM ERROR CORRECTION
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申请号: US14720315申请日: 2015-05-22
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公开(公告)号: US20160344414A1公开(公告)日: 2016-11-24
- 发明人: OFER NAAMAN , Bryan K. Eastin
- 申请人: OFER NAAMAN , Bryan K. Eastin
- 申请人地址: US VA Falls Church
- 专利权人: NORTHROP GRUMMAN SYSTEMS CORPORATION
- 当前专利权人: NORTHROP GRUMMAN SYSTEMS CORPORATION
- 当前专利权人地址: US VA Falls Church
- 主分类号: H03M13/15
- IPC分类号: H03M13/15 ; G06N99/00
摘要:
Systems and methods are provided for quantum error correction. A quantum system includes an array of qubits configured to store an item of quantum information. The array of qubits includes a plurality of data qubits and a plurality of measurement qubits configured to extract a syndrome representing agreement among the plurality of data qubits. The quantum system further includes an integrated circuit comprising validation logic configured to determine if the syndrome is valid, decoding logic configured to determine evaluate the syndrome to determine location of errors within the plurality of data qubits, and an error register configured to store locations of the determined errors.
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