发明申请
- 专利标题: PROVIDING AUTONOMOUS SELF-TESTING OF A PROCESSOR
- 专利标题(中): 提供处理器的自动自检
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申请号: US14737768申请日: 2015-06-12
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公开(公告)号: US20160364308A1公开(公告)日: 2016-12-15
- 发明人: Vedvyas Shanbhogue , Eric Rasmussen , Deep K. Buch , Gordon McFadden , Kameswar Subramaniam , Amy L. Santoni , Willard M. Wiseman , Bret L. Toll
- 申请人: Vedvyas Shanbhogue , Eric Rasmussen , Deep K. Buch , Gordon McFadden , Kameswar Subramaniam , Amy L. Santoni , Willard M. Wiseman , Bret L. Toll
- 主分类号: G06F11/263
- IPC分类号: G06F11/263 ; G06F11/22
摘要:
In an embodiment, a processor includes at least one core, a power management unit having a first test register including a first field to store a test patch identifier associated with a test patch and a second field to store a test mode indicator to request a core functionality test, and a microcode storage to store microcode to be executed by the at least one core. Responsive to the test patch identifier, the microcode may access a firmware interface table and obtain the test patch from a non-volatile storage according to an address obtained from the firmware interface table. Other embodiments are described and claimed.
公开/授权文献
- US09612930B2 Providing autonomous self-testing of a processor 公开/授权日:2017-04-04
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