发明申请
US20160364308A1 PROVIDING AUTONOMOUS SELF-TESTING OF A PROCESSOR 有权
提供处理器的自动自检

PROVIDING AUTONOMOUS SELF-TESTING OF A PROCESSOR
摘要:
In an embodiment, a processor includes at least one core, a power management unit having a first test register including a first field to store a test patch identifier associated with a test patch and a second field to store a test mode indicator to request a core functionality test, and a microcode storage to store microcode to be executed by the at least one core. Responsive to the test patch identifier, the microcode may access a firmware interface table and obtain the test patch from a non-volatile storage according to an address obtained from the firmware interface table. Other embodiments are described and claimed.
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