Invention Application
- Patent Title: SYSTEM ON CHIP AND VERIFICATION METHOD THEREOF
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Application No.: US15257063Application Date: 2016-09-06
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Publication No.: US20160371092A1Publication Date: 2016-12-22
- Inventor: Sung-Boem PARK , Jin-Sung PARK , Ara CHO
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2014-0091962 20140721
- Main IPC: G06F9/38
- IPC: G06F9/38 ; G06F9/30

Abstract:
A verification method of a system on chip includes receiving a test generator and an exception handler; generating, by the test generator, a test program including an exception-causing instruction based on a test template; executing a first instruction at a first operating state as the test program is executed; stopping the execution of the test program and performing a fixed instruction sequence included in the exception handler when the exception-causing instruction is executed during the execution of the test program; and resuming the test program from a second instruction at a second operating state set after the fixed instruction sequence is performed, the second instruction corresponding to an address adjacent to an address of the exception-causing instruction.
Public/Granted literature
- US09990205B2 System on chip and verification method thereof Public/Granted day:2018-06-05
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