Invention Application
US20160377415A1 SYSTEM AND METHOD FOR MEASURING REFLECTED OPTICAL DISTORTION IN CONTOURED PANELS HAVING SPECULAR SURFACES
有权
用于测量具有表面表面的面板中的反射光学失真的系统和方法
- Patent Title: SYSTEM AND METHOD FOR MEASURING REFLECTED OPTICAL DISTORTION IN CONTOURED PANELS HAVING SPECULAR SURFACES
- Patent Title (中): 用于测量具有表面表面的面板中的反射光学失真的系统和方法
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Application No.: US14752119Application Date: 2015-06-26
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Publication No.: US20160377415A1Publication Date: 2016-12-29
- Inventor: Jason C. ADDINGTON , Michael J. VILD , Benjamin L. MORAN
- Applicant: GLASSTECH, INC.
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G06K9/52 ; G06T7/00

Abstract:
A system for measuring reflected optical distortion in a contoured panel having a specular surface includes a conveyor for conveying the panel in a first direction, at least one display projecting a preselected multi-phase non-repeating contrasting pattern, and at least one camera, each one of the cameras uniquely paired with one of the displays. The system may also include a control programmed to execute logic for controlling each of the cameras to acquire the desired images, and logic for analyzing and combining the data acquired by the cameras to construct a definition of the surface of the panel, and logic for performing one or more optical processing operations on the surface data to analyze the optical characteristics of the panel.
Public/Granted literature
- US09952039B2 System and method for measuring reflected optical distortion in contoured panels having specular surfaces Public/Granted day:2018-04-24
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